"DX centers in CdTe:In layers grown by MBE", A. K. Zakrzewski, L. Dobaczewski, T. Wojtowicz, J. Kossut, and G. Karczewski, Proceedings of 23rd International Conference on the Physics of Semiconductors, Berlin 1996 (in print).
"Analysis of Photoinduced Transient Spectroscopy (PICTS) Data by a Regularisation Method: Application to Compensation Defects in CdTe," C.Eiche, D.Maier, J.Weese, and K.W.Benz, Advanced Materials for Optics and Electronics, vol. 3, p. 269-274 (1994).
"Investigation of compensation defects in CdTe:Cl samples grown by different techniques" C.Eiche, D.Maier, D.Sinerius, J.Weese, K.W.Benz, and J.Honerkamp, J. Appl. Phys., vol. 74, p. 6667-6670 (1993)